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Ivona Mitrovic

Professor Ivona Mitrovic
PhD, MSc, BSc EE

Contact

Ivona@liverpool.ac.uk

+44 (0)151 794 4516

Research

I offer PhD and MSc projects on pressing engineering topics in sustainable nano energy and power electronics; such as energy harvesting using new materials and device concepts (thin films, plasmonics, perovskites), oxide materials for wide band gap semiconductors (GaN, SiC, Ga2O3), bio-sensors. The Lab is equipped with fabrication and characterisation tools, including sputtering, metallisation, variable angle spectroscopic ellipsometry (VASE), electrical characterisation. Apply for postgraduate research

Materials for energy harvesting applications

Theoretical understanding, fabrication and characterization of nanostructures, which employ resonant tunnelling and plasmonics effects, for energy harvesting in THz region.

High-k dielectrics

Theoretical understanding and engineering solutions for novel high-k dielectric stacks down to the 5 nm node (2022 ITRS generation).
In particular Ge-channel devices as well as high-k oxides on GaN for power electronics.

DNA bio-transistors and sensors

Exploration of DNA bio-polymers for electronic applications, within Grand Challenge ‘Silicon meets life: interfacing electronics to biology’,

Research grants

Portable and low-cost Mass Based Sensing of Hydrocarbons

ENGINEERING & PHYSICAL SCIENCES RESEARCH COUNCIL

February 2018 - September 2018

Dielectric engineering on GaN for sustainable energy applications

UK-INDIA EDUCATION AND RESEARCH INITIATIVE (UK)

April 2018 - March 2021

Making Sense of your Sole

ENGINEERING & PHYSICAL SCIENCES RESEARCH COUNCIL

June 2015 - January 2016

ZnO MESFETs for application to Intelligent Windows

ENGINEERING & PHYSICAL SCIENCES RESEARCH COUNCIL

May 2013 - May 2016

Engineered resonant tunnelling nanostructures for Terahertz realm

ENGINEERING & PHYSICAL SCIENCES RESEARCH COUNCIL

April 2013 - March 2015

High permittivity dielectrics on Ge for end of Roadmap application.

ENGINEERING & PHYSICAL SCIENCES RESEARCH COUNCIL

January 2011 - March 2014

Small items of Research Equipment at the University of Liverpool

ENGINEERING & PHYSICAL SCIENCES RESEARCH COUNCIL

November 2012 - March 2013

Impact Acceleration Account - University of Liverpool 2012

ENGINEERING & PHYSICAL SCIENCES RESEARCH COUNCIL

October 2012 - March 2017

    Research collaborations

    Prof. O. Engstrom

    High-k dielectrics

    Chalmers University of Technology, Sweden

    Band offset measurements and defects in high-k oxides.

    Dr P.-E. Hellstrom

    Ge interface engineering

    KTH Royal Institute of Technology, Sweden

    Research on rare-earth Tm2O3 dielectrics on germanium.

    Dr S. Schamm-Chardon

    HRTEM and EELS studies

    CEMES-CNRS and Université de Toulouse, Toulouse, France

    Research on HRTEM and EELS characterisation on rare-earth high-k oxides on Si and Ge.

    Dr J. Hilfiker

    VUV-VASE

    LOT-Oriel Ltd, Nebraska, USA

    Vacuum ultra-violet variable angle spectroscopic ellipsometry (VUV-VASE) studies of high-k gate stacks for advanced CMOS devices applications.

    Dr P. Williams

    High-k dielectrics precursors development

    SAFC Hitech Ltd, UK

    Hitech has been strong supporter of Electrical Engineering and Electronics grants related to fabricating devices by various depositions methods (ALD, CVD, MBE) in the state-of-the-art Laboratory in School of Engineering. They have provided continuous support in terms of precursors supply for various high-k oxides depositions over last decade.

    Dr V.R. Dhanak

    X-ray photoelectron (XPS) characterisation

    Physical characterisation of high-k gate stacks for advanced CMOS, ZnO and energy harvesting devices applications.

    Prof. P. Chalker

    Deposition of high-k dielectrics

    ALD, CVD and MBE deposition of a number of different material systems for applications in advanced CMOS, power electronics and energy harvesting devices. This prolific collaboration has been on-going for the past 10 years.

    Prof. K. Durose

    MIIM and ZnO based devices

    Deposition, electrical and physical characterisation of metal-insulator-insulator-metal rectifiers for applications in nantennas for energy harvesting; also ZnO-based devices.

    Prof. S. Beeby

    Nanorectifiers for NIR energy harvesting

    University of Southampton

    ALD and sputtering deposition of metal/insulator based nanostructures.

    Dr J. Schubert

    High-k dielectrics

    Research Centre Julich, Germany

    Physical and electrical characterisation study of LaLuO3 on Si gate stacks for advanced CMOS devices.

    Prof. I.G. Thayne

    High-k dielectrics on GaN

    University of Glasgow

    XPS study of high-k dielectrics on GaN for applications in power electronics devices.

    Prof. A. Peaker

    High-k dielectrics

    University of Manchester

    Electrical characterisation of high-k dielectrics for CMOS applications.

    Dr A. Dimoulas

    Ge interface engineering

    NCSR Demokritos, MBE Laboratory, Institute of Materials Science, Greece

    Research on rare earth La2O3 and Y2O3 dielectrics on germanium.

    Prof. B. Hamilton

    High-k dielectrics

    University of Manchester

    Breakdown mechanisms in high-k gate stacks by a conductive atomic force microscope (C-AFM).

    Dr P. Hurley

    Deposition and characterisation of high-k dielectrics

    University College Cork and Tyndall National Institute, Ireland

    Deposition of W for MIIM nanorectifiers.

    Dr A. Santoni

    XPS study

    ENEA, Frascati Research Centre, Italy

    XPS studies on RE-oxides for Ge channel devices.

    Dr T.C.Q. Noakes

    High-k dielectrics

    STFC Daresbury Laboratory, UK

    MEIS studies on ultra-thin high-k gate stacks.

    Prof. H. Przewlocki

    Internal photoemission (IPS) study

    Institute of Electron Technology, Poland

    Analysis and interpretation of band offsets derivation on high-k gate stacks by XPS and IPS.

    Prof. P. Ashburn

    SiGeC HBTs

    University of Southampton

    Electrical characterisation of SiGe and SiGeC heterojunction bipolar transistors (HBTs) for RF communications.

    Dr I. Alexandrou

    High-k dielectrics

    NanoPort FEI COMPANY, Eindhoven, The Netherlands

    HRTEM and EELS studies on LaLuO3 based gate stacks on Si for advanced CMOS devices applications.

    Dr O. Buiu

    Spectroscopic ellipsometry

    LOT-Oriel SRL Company, Bucharest, Romania

    Assessment of thickness and optical constants of high-k gate stacks by spectroscopic ellipsometry technique in the infra-red energy region.