Publications
2024
Non-invasive Methodology for the Age Estimation of ICs using Gaussian Process Regression
Khursheed, S. -S., & Acharyya, A. (n.d.). Non-invasive Methodology for the Age Estimation of ICs using Gaussian Process Regression. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
2023
PCB Hardware Trojan Run-Time Detection Through Machine Learning.
Piliposyan, G., & Khursheed, S. (2023). PCB Hardware Trojan Run-Time Detection Through Machine Learning.. IEEE Trans. Computers, 72, 1958-1970.
2022
PCB Hardware Trojan Run-time Detection Through Machine Learning
Piliposyan, G., & Khursheed, S. -S. (2022). PCB Hardware Trojan Run-time Detection Through Machine Learning. IEEE Transactions on Computers.
Remaining Useful Life (RUL) Regression Using Long-Short Term Memory (LSTM) Networks
Yousuf, S., Khan, S., & Khursheed, S. -S. (2022). Remaining Useful Life (RUL) Regression Using Long-Short Term Memory (LSTM) Networks. Microelectronics Reliability. doi:10.1016/j.microrel.2022.114772
Computer Vision for Hardware Trojan Detection on a PCB Using Siamese Neural Network
Piliposyan, G., & Khursheed, S. (2022). Computer Vision for Hardware Trojan Detection on a PCB Using Siamese Neural Network. In 2022 IEEE PHYSICAL ASSURANCE AND INSPECTION OF ELECTRONICS (PAINE) (pp. 15-21). doi:10.1109/PAINE56030.2022.10014967
Operational Age Estimation of ICs using Gaussian Process Regression
Narwariya, A. S., Das, P., Khursheed, S., & Acharyya, A. (2022). Operational Age Estimation of ICs using Gaussian Process Regression. In 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (pp. 1-5). IEEE. doi:10.1109/dft56152.2022.9962355
Online Remaining Useful Lifetime Prediction Using Support Vector Regression
Martinez, A. L. H., Khursheed, S., Alnuayri, T., & Rossi, D. (2022). Online Remaining Useful Lifetime Prediction Using Support Vector Regression. IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING, 10(3), 1546-1557. doi:10.1109/TETC.2021.3106252
Hardware Trojan Detection on a PCB Through Differential Power Monitoring
Piliposyan, G., Khursheed, S., & Rossi, D. (2022). Hardware Trojan Detection on a PCB Through Differential Power Monitoring. IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING, 10(2), 740-751. doi:10.1109/TETC.2020.3035521
Hardware Trojan Detection on a PCB Through Differential Power Monitoring.
Piliposyan, G., Khursheed, S., & Rossi, D. (2022). Hardware Trojan Detection on a PCB Through Differential Power Monitoring.. IEEE Trans. Emerg. Top. Comput., 10, 740-751.
2021
A Support Vector Regression based Machine Learning method for on-chip Aging Estimation
Alnuayri, T., Martinez, A. L. H., Khursheed, S., & Rossi, D. (2021). A Support Vector Regression based Machine Learning method for on-chip Aging Estimation. In 2021 4th International Conference on Computing & Information Sciences (ICCIS) (pp. 1-6). IEEE. doi:10.1109/iccis54243.2021.9676376
An Exploration of Microprocessor Self-Test Optimisation Based On Safe Faults
Narang, A., Venu, B., Khursheed, S. -S., & Harrod, P. (2021). An Exploration of Microprocessor Self-Test Optimisation Based On Safe Faults. In 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems.
Differential Aging Sensor using Sub-threshold Leakage Current to Detect Recycled ICs
Alnuayri, T., Khursheed, S. -S., Hernández Martínez, A. L., & Rossi, D. (2021). Differential Aging Sensor using Sub-threshold Leakage Current to Detect Recycled ICs. IEEE Transactions on Very Large Scale Integration Systems.
IC age estimation methodology using IO pad protection diodes for prevention of Recycled ICs
Kalanadhabhatta, S., Dutt, R., Khursheed, S., Acharyya, A., & IEEE. (2021). IC age estimation methodology using IO pad protection diodes for prevention of Recycled ICs. In 2021 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS). doi:10.1109/ISCAS51556.2021.9401363
Differential Aging Sensor to Detect Recycled ICs using Sub-threshold Leakage Current
Alnuayri, T., Khursheed, S., Martinez, A. L. H., & Rossi, D. (2021). Differential Aging Sensor to Detect Recycled ICs using Sub-threshold Leakage Current. In PROCEEDINGS OF THE 2021 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE 2021) (pp. 1500-1503). doi:10.23919/DATE51398.2021.9473975
2020
A Cost-Aware Framework for Lifetime Reliability of TSV based 3D-IC design
Reddy, R. P., Acharyya, A., & Khursheed, S. (2020). A Cost-Aware Framework for Lifetime Reliability of TSV-Based 3D-IC Design. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 67(11), 2677-2681. doi:10.1109/TCSII.2020.2970724
Secure Scan Design with a Novel Methodology of Scan Camouflaging
Kalanadhabhatta, S., Anumandla, K. K., Khursheed, S., & Acharyya, A. (2020). Secure Scan Design with a Novel Methodology of Scan Camouflaging. In 24TH IEEE EUROPEAN CONFERENCE ON CIRCUIT THEORY AND DESIGN (ECCTD 2020). Retrieved from https://www.webofscience.com/
Leveraging CMOS Aging for Efficient Microelectronics Design
Martinez, A. L. H., Khursheed, S., & Rossi, D. (2020). Leveraging CMOS Aging for Efficient Microelectronics Design. In 2020 26TH IEEE INTERNATIONAL SYMPOSIUM ON ON-LINE TESTING AND ROBUST SYSTEM DESIGN (IOLTS 2020). doi:10.1109/iolts50870.2020.9159742
LFSR generation for high test coverage and low hardware overhead
Martínez, L. H., Khursheed, S., & Reddy, S. M. (2020). LFSR generation for high test coverage and low hardware overhead. IET Computers & Digital Techniques, 14(1), 27-36. doi:10.1049/iet-cdt.2019.0042
2019
A Framework for TSV based 3D-IC to Analyze Aging and TSV Thermo-mechanical stress on Soft Errors
Reddy, R. P., Acharyya, A., & Khursheed, S. (2019). A Framework for TSV based 3D-IC to Analyze Aging and TSV Thermo-mechanical stress on Soft Errors. In 2019 IEEE INTERNATIONAL TEST CONFERENCE IN ASIA (ITC-ASIA 2019) (pp. 121-126). doi:10.1109/ITC-Asia.2019.00034
Guest Editorial: Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Miele, A., Trefzer, M. A., & Khursheed, S. (2019). Guest Editorial: Defect and Fault Tolerance in VLSI and Nanotechnology Systems. IET COMPUTERS AND DIGITAL TECHNIQUES, 13(3), 127-128. doi:10.1049/iet-cdt.2019.0097
Detection of Recycled ICs via On-Chip Leakage Current Sensors
Khursheed, S., & Rossi, D. (2019, July 1). Detection of Recycled ICs via On-Chip Leakage Current Sensors. In 4th International Verification and Security Workshop (IVSW). Rhodes Island, Greece.
Fault Tolerance in 3D-ICs
Reddy, R. P., Acharyya, A., & Khursheed, S. (2019). Fault Tolerance in 3D-ICs. In Internet of Things (pp. 155-178). Springer International Publishing. doi:10.1007/978-3-030-02807-7_8
2018
Foreword
Foreword (2018). In 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (pp. 1). IEEE. doi:10.1109/dft.2018.8602980
Recycled IC Detection through Aging Sensor
Rossi, D., Tenentes, V., Khursheed, S., & Reddy, S. (2018). Recycled IC Detection through Aging Sensor. In European Test Symposium.
Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs
Tenentes, V., Rossi, D., Khursheed, S. S., Al-Hashimi, B. M., & Chakrabarty, K. (2018). Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs.. IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems, 37(4), 883-895. doi:10.1109/TCAD.2017.2729462
2017
Improved Wire Length-Driven Placement Technique for Minimizing Wire Length, Area and Timing
Sabbavarapu, S., Basireddy, K. R., Acharyya, A., & Khursheed, S. (2017). Improved Wire Length-Driven Placement Technique for Minimizing Wire Length, Area and Timing. JOURNAL OF LOW POWER ELECTRONICS, 13(3), 456-471. doi:10.1166/jolpe.2017.1506
A Cost-Effective Fault Tolerance Technique for Functional TSV in 3-D ICs
Reddy, R. P., Acharyya, A., & Khursheed, S. (2017). A Cost-Effective Fault Tolerance Technique for Functional TSV in 3-D ICs. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 25(7), 2071-2080. doi:10.1109/TVLSI.2017.2681703
Welcome message
Welcome message (2017). In 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (pp. iii-v). IEEE. doi:10.1109/dft.2017.8244425
Coarse-grained Online Monitoring of BTI Aging by Reusing Power Gating Infrastructure
Tenentes, V., Rossi, D., Yang, S., Khursheed, S., Al-Hashimi, B. M., & Gunn, S. R. (2017). Coarse-grained Online Monitoring of BTI Aging by Reusing Power Gating Infrastructure. IEEE Transactions on Very Large Scale Integration Systems, 25(4), 1397-1407. doi:10.1109/TVLSI.2016.2626218
Aging Benefits in Nanometer CMOS Designs
Rossi, D., Tenentes, V., Yang, S., Khursheed, S., & Al-Hashimi, B. M. (2017). Aging Benefits in Nanometer CMOS Designs. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 64(3), 324-328. doi:10.1109/TCSII.2016.2561206
2016
Co-optimization of fault tolerance, wirelength and temperature mitigation in TSV-based 3D ICs
Zhao, Y., Khursheed, S., Al-Hashimi, B. M., & Zhao, Z. (2016). Co-optimization of fault tolerance, wirelength and temperature mitigation in TSV-based 3D ICs. In 2016 IFIP/IEEE INTERNATIONAL CONFERENCE ON VERY LARGE SCALE INTEGRATION (VLSI-SOC). Retrieved from https://www.webofscience.com/
Reconfigurable hardware-software codesign methodology for protein identification
Khursheed, S. (2016). Reconfigurable hardware-software codesign methodology for protein identification. doi:10.1109/EMBC.2016.7591227
Reliable Power Gating With NBTI Aging Benefits
Rossi, D., Tenentes, V., Yang, S., Khursheed, S., & Al-Hashimi, B. M. (2016). Reliable Power Gating With NBTI Aging Benefits. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 24(8), 2735-2744. doi:10.1109/TVLSI.2016.2519385
Guest Editors' Introduction: Robust 3-D Stacked ICs
Khursheed, S., Vivet, P., Hopsch, F., & Marinissen, E. J. (2016). Guest Editors' Introduction: Robust 3-D Stacked ICs. IEEE Design & Test, 33(3), 6-7. doi:10.1109/mdat.2016.2542210
Application-Specific Memory Protection Policies for Energy-Efficient Reliable Design
Yang, S., Shafik, R. A., Khursheed, S., Flynn, D., Merrett, G. V., & Al-Hashimi, B. M. (2015). Application-Specific Memory Protection Policies for Energy-Efficient Reliable Design. In 2015 INTERNATIONAL SYMPOSIUM ON RAPID SYSTEM PROTOTYPING (RSP) (pp. 18-24). Retrieved from https://www.webofscience.com/
2015
DFT Architecture With Power-Distribution-Network Consideration for Delay-Based Power Gating Test
Tenentes, V., Khursheed, S., Rossi, D., Yang, S., & Al-Hashimi, B. M. (2015). DFT Architecture With Power-Distribution-Network Consideration for Delay-Based Power Gating Test. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 34(12), 2013-2024. doi:10.1109/TCAD.2015.2446939
BTI and Leakage Aware Dynamic Voltage Scaling for Reliable Low Power Cache Memories
Rossi, D., Tenentes, V., Khursheed, S., & Al-Hashimi, B. M. (2015). BTI and Leakage Aware Dynamic Voltage Scaling for Reliable Low Power Cache Memories. In 2015 IEEE 21ST INTERNATIONAL ON-LINE TESTING SYMPOSIUM (IOLTS) (pp. 194-199). Retrieved from https://www.webofscience.com/
Online Fault Tolerance Technique for TSV-Based 3-D-IC
Zhao, Y., Khursheed, S., & Al-Hashimi, B. M. (2015). Online Fault Tolerance Technique for TSV-Based 3-D-IC. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 23(8), 1567-1571. doi:10.1109/TVLSI.2014.2343156
Diagnosis of Power Switches with Power-Distribution-Network Consideration
Tenentes, V., Rossi, D., Khursheed, S., & Al-Hashimi, B. M. (2015). Diagnosis of Power Switches with Power-Distribution-Network Consideration. In 2015 20th IEEE European Test Symposium (ETS). Retrieved from https://www.webofscience.com/
NBTI and Leakage Aware Sleep Transistor Design for Reliable and Energy Efficient Power Gating
Rossi, D., Tenentes, V., Khursheed, S., & Al-Hashimi, B. M. (2015). NBTI and Leakage Aware Sleep Transistor Design for Reliable and Energy Efficient Power Gating. In 2015 20TH IEEE EUROPEAN TEST SYMPOSIUM (ETS). Retrieved from https://www.webofscience.com/
2014
High Quality Testing of Grid Style Power Gating
Tenentes, V., Khursheed, S., Al-Hashimi, B. M., Zhong, S., & Yang, S. (2014). High Quality Testing of Grid Style Power Gating. In 2014 IEEE 23RD ASIAN TEST SYMPOSIUM (ATS) (pp. 186-191). doi:10.1109/ATS.2014.37
Delay Test for Diagnosis of Power Switches
Khursheed, S., Shi, K., Al-Hashimi, B. M., Wilson, P. R., & Chakrabarty, K. (2014). Delay Test for Diagnosis of Power Switches. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 22(2), 197-206. doi:10.1109/TVLSI.2013.2239319
Efficient Variation-Aware Delay Fault Simulation Methodology for Resistive Open and Bridge Defects
Zhong, S., Khursheed, S., Al-Hashimi, B. M., & Zhao, W. (2014). Efficient Variation-Aware Delay Fault Simulation Methodology for Resistive Open and Bridge Defects. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 33(5), 798-810. doi:10.1109/TCAD.2013.2295812
2013
Impact of PVT variation on Delay Test of Resistive Open and Resistive Bridge Defects
Thong, S., Khursheed, S., & Al-Hashimi, B. M. (2013). Impact of PVT variation on Delay Test of Resistive Open and Resistive Bridge Defects. In PROCEEDINGS OF THE 2013 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS (DFTS) (pp. 230-235). Retrieved from https://www.webofscience.com/
Improved State Integrity of Flip-Flops for Voltage Scaled Retention Under PVT Variation
Yang, S., Khursheed, S., Al-Hashimi, B. M., Flynn, D., & Merrett, G. V. (2013). Improved State Integrity of Flip-Flops for Voltage Scaled Retention Under PVT Variation. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 60(11), 2953-2961. doi:10.1109/TCSI.2013.2252640
2011
Analysis of Resistive Bridge Defect Delay Behavior in the Presence of Process Variation
Zhong, S., Khursheed, S., Al-Hashimi, B. M., Reddy, S. M., & Chakrabarty, K. (2011). Analysis of Resistive Bridge Defect Delay Behavior in the Presence of Process Variation. In 2011 20TH ASIAN TEST SYMPOSIUM (ATS) (pp. 389-394). doi:10.1109/ATS.2011.16
Cost-Effective TSV Grouping for Yield Improvement of 3D-ICs
Zhao, Y., Khursheed, S., & Al-Hashimi, B. M. (2011). Cost-Effective TSV Grouping for Yield Improvement of 3D-ICs. In 2011 20TH ASIAN TEST SYMPOSIUM (ATS) (pp. 201-206). doi:10.1109/ATS.2011.37
Reliable State Retention-Based Embedded Processors Through Monitoring and Recovery
Yang, S., Khursheed, S., Al-Hashimi, B. M., Flynn, D., & Idgunji, S. (2011). Reliable State Retention-Based Embedded Processors Through Monitoring and Recovery. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 30(12), 1773-1785. doi:10.1109/TCAD.2011.2166590
A Fast and Accurate Process Variation-Aware Modeling Technique for Resistive Bridge Defects
Zhong, S., Khursheed, S., & Al-Hashimi, B. M. (2011). A Fast and Accurate Process Variation-Aware Modeling Technique for Resistive Bridge Defects. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 30(11), 1719-1730. doi:10.1109/TCAD.2011.2162065
Improved DFT for Testing Power Switches
Khursheed, S., Yang, S., Al-Hashimi, B. M., Huang, X., & Flynn, D. (2011). Improved DFT for Testing Power Switches. In 2011 16TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) (pp. 7-12). doi:10.1109/ETS.2011.63
2010
Test Strategies for Multivoltage Designs
Khursheed, S., & Al-Hashimi, B. M. (2010). Test Strategies for Multivoltage Designs. In POWER-AWARE TESTING AND TEST STRATEGIES FOR LOW POWER DEVICES (pp. 243-271). doi:10.1007/978-1-4419-0928-2_8
Gate-Sizing-Based Single V<sub>dd</sub> Test for Bridge Defects in Multivoltage Designs
Khursheed, S., Al-Hashimi, B. M., Chakrabarty, K., & Harrod, P. (2010). Gate-Sizing-Based Single V<sub>dd</sub> Test for Bridge Defects in Multivoltage Designs. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 29(9), 1409-1421. doi:10.1109/TCAD.2010.2059310
Scan Based Methodology for Reliable State Retention Power Gating Designs
Yang, S., Al-Hashimi, B. M., Flynn, D., & Khursheed, S. (2010). Scan Based Methodology for Reliable State Retention Power Gating Designs. In 2010 DESIGN, AUTOMATION & TEST IN EUROPE (DATE 2010) (pp. 69-74). Retrieved from https://www.webofscience.com/
Modeling the Impact of Process Variation on Resistive Bridge Defects
Khursheed, S., Zhong, S., Al-Hashimi, B. M., Aitken, R., & Kundu, S. (2010). Modeling the Impact of Process Variation on Resistive Bridge Defects. In INTERNATIONAL TEST CONFERENCE 2010. Retrieved from https://www.webofscience.com/
2009
Diagnosis of Multiple-Voltage Design With Bridge Defect
Khursheed, S., Al-Hashimi, B. M., Reddy, S. M., & Harrod, P. (2009). Diagnosis of Multiple-Voltage Design With Bridge Defect. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 28(3), 406-416. doi:10.1109/TCAD.2009.2013540
Process Variation-Aware Test for Resistive Bridges
Ingelsson, U., Al-Hashimi, B. M., Khursheed, S., Reddy, S. M., & Harrod, P. (2009). Process Variation-Aware Test for Resistive Bridges. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 28(8), 1269-1274. doi:10.1109/TCAD.2009.2021728
Test Cost Reduction for Multiple-Voltage Designs with Bridge Defects through Gate-Sizing
Khursheed, S., Al-Hashimi, B. M., & Harrod, P. (2009). Test Cost Reduction for Multiple-Voltage Designs with Bridge Defects through Gate-Sizing. In DATE: 2009 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, VOLS 1-3 (pp. 1349-+). Retrieved from https://www.webofscience.com/
2008
Bridge defect diagnosis for multiple-voltage design
Khursheed, S., Rosinger, P., Al-Hashimi, B. M., Reddy, S. M., & Harrod, P. (2008). Bridge defect diagnosis for multiple-voltage design. In PROCEEDINGS OF THE 13TH IEEE EUROPEAN TEST SYMPOSIUM: ETS 2008 (pp. 99-+). doi:10.1109/ETS.2008.14
Bridging fault test method with adaptive, power management awareness
Khursheed, S., Ingelsson, U., Rosinger, P., Al-Hashimi, B. M., & Harrod, P. (2008). Bridging fault test method with adaptive, power management awareness. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 27(6), 1117-1127. doi:10.1109/TCAD.2008.923247
2007
Resistive bridging faults DFT with adaptive power management awareness
Ingelsson, U., Rosinger, P., Khursheed, S. S., Al-Hashimi, B. M., & Harrod, P. (2007). Resistive bridging faults DFT with adaptive power management awareness. In PROCEEDINGS OF THE 16TH ASIAN TEST SYMPOSIUM (pp. 101-+). doi:10.1109/ATS.2007.69
Efficient test compaction for combinational circuits based on Fault detection count-directed clustering
El-Maleh, A., & Khursheed, S. (2007). Efficient test compaction for combinational circuits based on Fault detection count-directed clustering. IET COMPUTERS AND DIGITAL TECHNIQUES, 1(4), 364-368. doi:10.1049/iet-cdt:20070004
2006
Efficient static compaction techniques for sequential circuits based on reverse-order restoration and test relaxation
El-Maleh, A. H., Khursheed, S. S., & Sait, S. M. (2006). Efficient static compaction techniques for sequential circuits based on reverse-order restoration and test relaxation. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 25(11), 2556-2564. doi:10.1109/TCAD.2006.873895
2005
Efficient static compaction techniques for sequential circuits based on Reverse Order Restoration and test relaxation
El-Maleh, A. H., Khursheed, S. S., & Sait, S. M. (2005). Efficient static compaction techniques for sequential circuits based on Reverse Order Restoration and test relaxation. In 14TH ASIAN TEST SYMPOSIUM, PROCEEDINGS (pp. 378-385). doi:10.1109/ATS.2005.53