The JEOL JSM 6610 SEM is a general-purpose instrument meeting the needs of a wide range of academic and industrial users, and ideally suited for routine SE & BSE imaging, and introducing new users to scanning electron microscopy.
It is equipped with an Oxford Xplore EDS detector with AZtec software for chemical composition analysis.
It comprises a large specimen chamber for larger (up to 8-inch diameter, 50mm height) samples, or up to 7 x 12.5mm diameter aluminium pin stubs. Specialist holders allow for mounting of 1.5” epoxy pucks, samples in cross-section, and analysis of TEM grids. AZtec Live allows for simultaneous analysis of sample morphology and elemental distribution in real time.
Back to: Scanning Electron Microscopy Shared Research Facility (SEM SRF)