X Ray Diffraction (XRD)
This Shared Research Facility (SRF) is designed to enable and accelerate the advanced structural characterisation of nanomaterials across multiple material classes with a wide range of morphologies targeted for specific application.
Low Energy Ion Scattering (LEIS)
LEIS is the method of determining the composition of the outer atomic layer of a materials surface, which is inherently involved in processes such as growth, etching, diffusion, adhesion and others
Ultrafast Transient Absorption Spectroscopy (TAS)
Ultrafast Transient Absorption Spectroscopy, TAS, is a pump-probe spectroscopic technique which facilitates the understanding of photochemical and photophysical processes.
Micro X-ray Computed Tomography (Micro X-ray CT)
Micro X-ray CT creates high resolution 3D images of materials without needing to section the samples.
Nanolithography Suite
The Heidelberg Instrument NanoFrazor Scholar is a thermal scanning probe lithography system capable of 20 nm resolution nanopatterning of thin films and substrates.