Structural Characterisation

Our structural characterisation facilities can enable and accelerate advanced structural characterisation of materials across multiple scale lengths for different materials classes and morphologies.

Albert Crewe Centre for Electron Microscopy (ACCEM)

We are working to extend Albert Crewe’s legacy with a strategic focus on the development of new approaches to imaging atomic scale dynamics in SEM, STEM and FIB (focused ion beam).

Photograph of a large piece of scientific equipment in the foreground, with a researcher working on it in the background.

Low Energy Ion Scattering Facility (LEIS)

Low-energy ion scattering (LEIS) is a method of determining the composition of the outer atomic layers of a material’s surface. This region is inherently involved in processes such as growth, etching, adsorption, adhesion, and others.

Scanning Electron Microscopy Facility (SEMSRF)

The SEM-SRF and its staff have wide ranging expertise in all aspects of Electron Microscopy imaging and microstructural characterisation of a wide range of sample types across multiple scale ranges (mm to nm). Utilising complementary analysis techniques, to facilitate complete characterisation, enables researchers to probe and find answers to their research questions.

Dark, close-up photograph of a piece of structural characterisation equipment.

Micro X-Ray CT Facility (XRM)

The Micro X-ray CT facility offers researchers access to a Zeiss Xradia Versa 620 X-ray Microscope (XRM). This X-ray Computed Tomography (X-ray CT) instrument is capable of showing differences in the X-ray attenuation of materials at sub-micron resolution.

X Ray Diffraction Facility (XRD)

The extreme surface sensitivity X Ray Diffraction is designed to enable and accelerate the advanced structural characterisation of nanomaterials across multiple material classes with a wide range of morphologies targeted for specific application.