Materials, Advanced Design
&
Manufacturing
102
Keywords
Silicon/silicon alloys, high-permittivity dielectrics,
conjugated polymer electronics, bipolar devices, MOS
devices, low-cost circuits/displays, THz rectification,
microelectromechanical systems (MEMS),
supercapacitors, sensors, solar cells/displays
Expertise
Solid state electronics, typically used in most circuits and
devices, are built entirely from solid materials in which the
electrons, or other charge carriers, are confined entirely
within the solid material. The University has expertise in
the electrical and optical characterisation of these
materials. We are also involved in the development of
novel solid state devices – accommodating every stage of
the design cycle, modelling, theory and reliability testing
using bespoke commercial tools.
Our work on inorganic semiconducting materials has
been mainly targeted at silicon and its alloy silicon-
germanium for application in bipolar and MOS devices.
Materials are assessed using a range of characterisation
techniques, often in novel MOS capacitor test structures
produced with low-temperature techniques. We have
extensive experience of high-permittivity dielectric
characterisation and realisation using atomic-layer
deposition and pioneered the production of microscale
quadropole mass-spectrometry using MEMS technology.
Cross disciplinary work aims to harvest solar energy
using rectenna devices incorporating metal-insulator-
metal rectifiers.
Our work on organic semiconductors focuses on
conjugated polymer electronics. This is an interdisciplinary
area of research which encompasses chemists, physicists
and engineers. Organic semiconductors could have a
potential impact on a range of applications, from general
low-cost circuits and displays to low-cost biosensors for
healthcare. Research into new display technologies
covers vertical transistor structures using polymer
materials where the film thickness can be used to define
very small channel lengths.
Capabilities and facilities
•
Low current characterisation including temperature
dependence, using a Hewlett Packard (HP)
parameter analyser and Keithley equipment
•
Spectro-ellipsometry including a stage for
temperature dependence and wafer mapping
•
Multi-frequency impedance measurements using
HP and Boonton meters.
4.2
Solid state electronics materials
For further information
on all our specialist
centres, facilities and
laboratories
go to page
179
