With a CEOS aberration corrector for the probe-forming optics (probe size FWHM 99% of the transmitted beam) with a full 4D dataset acquired in typically less than one minute, their full-field ptychographic reconstructions double the image resolution compared to the highest-resolution conventional single-channel imaging modes, such as ADF STEM.
As an example, users can access full-frame streaming at up to 92 frames per second with a 2K × 2K survey sensor.
For chemical and compositional analysis, the JEOL 2100F CS is equipped with an EDAX Octane T Optima windowless 60 mm2 SDD EDX detector and Gatan imaging filter (GIF) Quantum SE (model 963).
Aberration-corrected scanning transmission electron microscopy (AC-STEM) methods include:
- High-angle annular dark field imaging (HAADF-STEM)
- Bright field imaging (BF STEM)
- Transmission electron microscopy (TEM)
- Diffraction contrast (TEM bright field and dark field)
- Weak-beam imaging
- Selected area diffraction (SAED)
- Electron energy-loss spectroscopy (EELS)
- Energy-dispersive X-ray spectroscopy (EDXS)
- Energy-filtered TEM (EFTEM).